Tescan TEMSOR STEM

Analytical STEM with integrated beam precession for enhanced 4D-STEM and 3D-ED structural studies

Tescan TENSOR^™ enables fast and intuitive sample navigation and identification of regions of interest with their streamlined STEM imaging, EDS analysis, and 4D-STEM mapping. Use the fast (72,000 Hz), built-in, beam precession to improve accuracy and precision in strain analysis and phase-orientation mapping. The unprecedented speed of fully integrate beam precession provides high quality and accuracy of diffraction data that are processed on-the-fly and provide meaningful results interactively within minutes during sample analysis. Profit from the fully automated microscope alignments to obtain accurate and reproducible characterization of samples by all operators regardless of their TEM expertise and skills.

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Key benefits

Faster sample characterization: Benefit from a novel approach to sample navigation and acquisition of multimodal analytical STEM datasets without the need for lengthy microscope alignments and data acquisition optimization.
Routine 4D-STEM analysis: Enhance sample characterization by seamless 4D-STEM workflows made as easy as EDX elemental mapping.
Higher accuracy and precision: Improve sample characterization with precession-assisted 4D-STEM for accurate strain analysis and phase-orientation mapping.
Consistent results: Reduce operator variability through fully automated column alignments and guided workflows, ensuring reproducibility across shifts and sites.
Faster decision-making: Accelerate analysis with on-the-fly processing of acquired 4D-STEM data to provide meaningful and interpretable results interactively during sample analysis.